Statistically principled use of in-line measurements in intensity diffraction tomography
Year: 2007
Type: article
Authors: Yin Huang, Mark A. Anastasio
Institution: Illinois Institute of Technology
Language: English
Subfield: Atomic and Molecular Physics, and Optics
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2167943072