Year: 2010
Type: article
Abstract: Gaia will only achieve its unprecedented measurement accuracy requirements with detailed calibration and correction for radiation damage. We present our Silvaco 3D engineering software model of the Gaia CCD pixel and two of its applications for Gaia: (1) physically interpreting supplementary buried channel (SBC) capacity measurements (pocket-pumping and first pixel response) in terms of e2v manufacturing doping alignment tolerances; and (2) deriving electron densities within a charge packet as a function of the number of constituent electrons and 3D position within the charge packet as input to microscopic models being developed to simulate radiation damage.
Source: EAS Publications Series
DOI: 10.1051/eas/1045077
Authors: G.M. Seabroke, T. Prod’homme, G. Hopkinson, D. Burt, M. Robbins, A. Holland
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W2168605908