Work

Measurement-based large-signal diode model, automated data acquisition system, and verification with on-wafer power and harmonic measurements

Year: 2002

Type: conference-paper

Source: IEEE MTT-S International Microwave Symposium digest

DOI: 10.1109/mwsym.1993.276828

Authors: D.E. Root, M. Pirola, S. Fan, A. Cognata

Institutions: Hewlett-Packard (United States), Politecnico di Torino

Language: English

Topic: Advanced Power Amplifier Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2168908354

FWCI: 0.356

Cites: 4

Cited by: 4

Related to: 10