Work

Statistical fault injection: Quantified error and confidence

Year: 2009

Type: conference-paper

Source: Design, Automation, and Test in Europe

DOI: 10.1109/date.2009.5090716

Authors: R. Leveugle, A. Calvez, P. Maistri, P. Vanhauwaert

Institutions: Institut polytechnique de Grenoble, Centre National de la Recherche Scientifique, Université Joseph Fourier, Techniques of Informatics and Microelectronics for Integrated Systems Architecture

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2169184353

FWCI: 5.153

Cites: 16

Cited by: 444

Related to: 10