Work

Modeling the effect of technology trends on the soft error rate of combinational logic

Year: 2003

Type: conference-paper

Source: International Conference on Dependable Systems & Networks/Proceedings

DOI: 10.1109/dsn.2002.1028924

Authors: P. Shivakumar, M. Kistler, S.W. Keckler, D. Burger, L. Alvisi

Institutions: The University of Texas at Austin, IBM Research - Austin

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Science Foundation, Defense Advanced Research Projects Agency

OpenAlex ID: W2169213530

FWCI: 114.8

Cites: 31

Cited by: 1,462

Related to: 10