Work

Parasitic modeling and noise mitigation in advanced RF/mixed-signal silicon germanium processes

Year: 2003

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2003.810469

Authors: R. Singh, Y.V. Tretiakov, J.B. Johnson, S.L. Sweeney, R.L. Barry, M. Kumar, M. Erturk, J. Katzenstein, C.E. Dickey, D.L. Harame

Institution: IBM (United States)

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2169730278

FWCI: 2.677

Cites: 49

Cited by: 13

Related to: 10