Work

Reliable transport through a microfabricated X -junction surface-electrode ion trap

Year: 2013
Type: article
Abstract: We report the design, fabrication and characterization of a microfabricated surface-electrode ion trap that supports controlled transport through the two-dimensional intersection of linear trapping zones arranged in a 90° cross. The trap is fabricated with very large scalable integration techniques which are compatible with scaling to a large quantum information processor. The shape of the radio-frequency electrodes is optimized with a genetic algorithm to reduce axial pseudopotential barriers and minimize ion heating during transport. Seventy-eight independent dc control electrodes enable fine control of the trapping potentials. We demonstrate reliable ion transport between junction legs and determine the rate of ion loss due to transport. Doppler-cooled ions survive more than 10 5 round-trip transits between junction legs without loss and more than 65 consecutive round trips without laser cooling.
Language: English
Open Access status: gold
Estimated APC paid: $2,610
OpenAlex ID: W2169738367
FWCI: 4.758
Cites: 23
Cited by: 84
Related to: 10