ESD: a pervasive reliability concern for IC technologies
Year: 1993
Type: article
Source: Proceedings of the IEEE
DOI: 10.1109/5.220901
Authors: C. Duvvury, A. Amerasekera
Institution: Texas Instruments (United States)
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2170466905