Fault Localization Using Passive End-to-End Measurement and Sequential Testing for Wireless Sensor Networks
Year: 2009
Type: conference-paper
Authors: Bing Wang, Wei Wei, Wei Zeng, Krishna R. Pattipati
Institution: University of Connecticut
Language: English
Subfield: Computer Networks and Communications
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
Funder: National Science Foundation
OpenAlex ID: W2172173600