Work

Polarization-sensitive interferometric synthetic aperture microscopy

Year: 2015

Type: article

Abstract: Three-dimensional optical microscopy suffers from the well-known compromise between transverse resolution and depth-of-field. This is true for both structural imaging methods and their functional extensions. Interferometric synthetic aperture microscopy (ISAM) is a solution to the 3D coherent microscopy inverse problem that provides depth-independent transverse resolution. We demonstrate the extension of ISAM to polarization sensitive imaging, termed polarization-sensitive interferometric synthetic aperture microscopy (PS-ISAM). This technique is the first functionalization of the ISAM method and provides improved depth-of-field for polarization-sensitive imaging. The basic assumptions of polarization-sensitive imaging are explored, and refocusing of birefringent structures is experimentally demonstrated. PS-ISAM enables high-resolution volumetric imaging of birefringent materials and tissue.

Source: Applied Physics Letters

DOI: 10.1063/1.4936236

Authors: Fredrick A. South, Yuan-Zhi Liu, Yang Xu, Nathan D. Shemonski, P. Scott Carney, Stephen A. Boppart

Institution: University of Illinois Urbana-Champaign

Language: English

Topic: Digital Holography and Microscopy

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: bronze

Funders: National Institutes of Health, National Cancer Institute

Awards: G3210179440, G5906998854, G9000189174