Work

Improvement in accuracy of defect size measurement by automatic defect classification

Year: 2015

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.2202511

Authors: Bhamidipati Samir, Mark Pereira, Sankaranarayanan Paninjath, Chan-Uk Jeon, Dong-Hoon Chung, Gi-Sung Yoon, Hong-Yul Jung

Institution: Samsung Electronics (South Korea)

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2179682871

FWCI:

Cites: 7

Cited by: 5

Related to: 10