Work

X-ray microdiffraction studies to measure strain fields in a metal matrix composite

Year: 1997

Type: conference-paper

Abstract: An x-ray diffraction microscope has been used to map the strain field in a fiber-reinforced composite material. The monochromatic x-ray (11 keV) beam was focused by a phase zone plate to produce a focal spot of 1×4 μm2 on the specimen. The change in the peak position of diffraction patterns due to interatomic spacing change, caused by stress in the sample, was measured by using a two-dimensional CCD detector. The radial residual strain field in the fiber-reinforced composite (SCS-6/Ti-14Al-21Nb) was measured from diffraction patterns with a sensitivity of ∼10−4 and an average standard deviation of 9.4×10−5.

Source: AIP conference proceedings

DOI: 10.1063/1.54617

Authors: Heung-Rae Lee, Wenbing Yun, Zhonghou Cai, William Rodrigues, Davis S. Kupperman

Institutions: Argonne National Laboratory, Advanced Photon Source

Language: English

Topic: X-ray Diffraction in Crystallography

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: bronze

Funder: U.S. Department of Energy

Award: G2123841078