Direct observation of structural and defect evolution in C-rich SiC using in situ helium ion microscopy
Year: 2015
Type: article
Source: Nanoscale
DOI: 10.1039/c5nr06659j
Authors: Wen Liu, Laifei Cheng, Xiaoqiang Li, Yiguang Wang
Institution: Northwestern Polytechnical University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2181684797