Work

Temperature-Dependent Electrical Characterization of Multiferroic BiFeO3 Thin Films

Year: 2010

Type: article

Source: The Journal of Undergraduate Research at the University of Illinois at Chicago

DOI: 10.5210/jur.v4i1.7483

Authors: D. Hitchen, S. Ghosh

Institutions: Rutgers, The State University of New Jersey, University of Illinois Chicago

Language: English

Topic: Multiferroics and related materials

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2184502673

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