Work

Failure Analysis of Odd/Even Word-Line Failure to Improve the Endurance Performance of a

Year: 2009

Type: article

Authors: Young Sun, Mark Zhang, Jossen Yu, Walden Dong, Wei-Ting Kary Chien

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2185774673

FWCI:

Cites: 24

Cited by:

Related to: 6