Work

Influence of Interfacial Mixing on Thermal Boundary Conductance Across a Chromium/Silicon Interface

Year: 2008

Type: article

Source: ASME Journal of Heat and Mass Transfer

DOI: 10.1115/1.2897344

Authors: Patrick E. Hopkins, Pamela M. Norris, Robert J. Stevens, Thomas E. Beechem, Samuel Graham

Institutions: University of Virginia, Rochester Institute of Technology, Georgia Institute of Technology

Language: English

Topic: Thermal properties of materials

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2057938369

FWCI: 5.511

Cites: 56

Cited by: 140

Related to: 10