Thickness dependent microstructural and electrical properties of TiN thin films prepared by DC reactive magnetron sputtering
Year: 2015
Type: article
Source: Ceramics International
Language: English
Subfield: Mechanics of Materials
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: HfO2基新型铁电薄膜的自发极化机制和失效行为研究
OpenAlex ID: W2191151966
