Scaling like behaviour of resistivity observed in LaNiO 3 thin films grown on SrTiO 3 substrate by pulsed laser deposition
Year: 2015
Type: article
Abstract: We discuss the origin of the temperature dependence of resistivity ρ observed in highly oriented LaNiO3 thin films grown on SrTiO3 substrate by a pulsed laser deposition technique. All the experimental data are found to collapse into a single universal curve ρ(T, d) ∝ [T/T(sf)(d)]3/2 for the entire temperature interval (20K<T<300 K) with T(sf)(d) being the onset temperature for triggering a resonant scattering of conduction electrons by spin fluctuations in LaNiO3/SrTiO3 heterostructure.
Authors: S Sergeenkov, L Cichetto, M Zampieri, E Longo, F M Araújo-Moreira
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2221400818
