Work

Sensor-on-CMOS dielectric characterization using temperature modulation

Year: 2015

Type: conference-paper

Source: ARFTG Microwave Measurement Conference

DOI: 10.1109/arftg.2015.7381458

Authors: Jun-Chau Chien, Ali M. Niknejad

Institution: University of California, Berkeley

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2244227541

FWCI:

Cites: 11

Cited by: 1

Related to: 10