Work

Scanning Force Microscopy

Year: 1996

Type: book-chapter

Source: Wiley eBooks

Parent work: Handbook of Microscopy: Methods II: Applications in Materials Science, Solid‐State Physics and Chemistry

DOI: 10.1002/9783527620524.ch13

Authors: S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo

Institution: University of Antwerp

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2244721074

FWCI: 151.3

Cites: 112

Cited by: 726

Related to: 9