Work

Modulated Degradation of Transient Electronic Devices through Multilayer Silk Fibroin Pockets

Year: 2015

Type: article

Source: ACS Applied Materials & Interfaces

DOI: 10.1021/acsami.5b06059

Authors: Mark A. Brenckle, Huanyu Cheng, Sukwon Hwang, Hu Tao, Mark Paquette, David L. Kaplan, John A. Rogers, Yonggang Huang, Fiorenzo G. Omenetto

Institutions: Tufts University, Northwestern University, Korea University, The University of Texas at Austin, University of Illinois Urbana-Champaign

Language: English

Topic: Silk-based biomaterials and applications

Subfield: Biomaterials

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: Division of Materials Research, Air Force Office of Scientific Research

Awards: G1678181017, G541550329

OpenAlex ID: W2249105879

FWCI: 3.042

Cites: 29

Cited by: 76

Related to: 10