Work

High Resolution Imaging of Graphene on SiC by Contact Resonance AFM: Experiment and Theory

Year: 2015

Type: article

Source: Bulletin of the American Physical Society

Authors: Qing Tu, Bjoern I. Lange, J. M. J. Lopes, Stefan Zauscher, Volker Blüm

Language: English

Topic: Force Microscopy Techniques and Applications

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2249918072

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