Work

Experimental Investigation of the Electrostatic Discharge(ESD) Damage in Packaged Semiconductor Devices

Year: 2002

Type: article

Source: Journal of the Korean Society of Safety

Authors: 김상렬, 김두현, 강동규

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2252934741

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