Interphases and Interfaces: SEI Structure and Chemical Composition At Silicon Electrodes By Tof-SIMS and XPS
Year: 2013
Type: conference-abstract
Source: ECS Meeting Abstracts
Institutions: The University of Texas at Austin, Texas Materials Institute
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2259985806