Work

Mode Specific Backscattering in a Quantum Point Contact

Year: 2015

Type: article

Abstract: We demonstrate a scanning gate grid measurement technique consisting in measuring the conductance of a quantum point contact (QPC) as a function of gate voltage at each tip position. Unlike conventional scanning gate experiments, it allows investigating QPC conductance plateaus affected by the tip at these positions. We compensate the capacitive coupling of the tip to the QPC and discover that interference fringes coexist with distorted QPC plateaus. We spatially resolve the mode structure for each plateau.

Source: Nano Letters

DOI: 10.1021/acs.nanolett.5b03170

Authors: A. A. Kozikov, R. Steinacher, C. Rössler, T. Ihn, K. Ensslin, C. Reichl, W. Wegscheider

Institutions: ETH Zurich, Laboratory for Solid State Physics

Language: English

Topic: Quantum and electron transport phenomena

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: green

Funder: Schweizerischer Nationalfonds zur Förderung der Wissenschaftlichen Forschung

OpenAlex ID: W2267492067

FWCI: 1.183

Cites: 45

Cited by: 7

Related to: 10