Work

The Error of Accuracy for Two Regression Techniques: Does Psychometric Parallelism Matter?.

Year: 1997

Type: article

Authors: Te‐Sheng Chang, William K. Brookshire

Language: English

Topic: Psychometric Methodologies and Testing

Subfield: Management Science and Operations Research

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W227021135

FWCI:

Cites: 22

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Related to: 10