Work

Microscopic structure of the SiO2 /Si interface

Year: 1988

Type: article

Source: Physical review. B, Condensed matter

DOI: 10.1103/physrevb.38.6084

Authors: F. J. Himpsel, F. R. McFeely, A. Taleb-Ibrahimi, J. A. Yarmoff, G. Hollinger

Institution: IBM Research - Thomas J. Watson Research Center

Language: English

Topic: Semiconductor materials and devices

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2273886880

FWCI: 37.93

Cites: 72

Cited by: 1,841

Related to: 10