Work

Improvement in the Photo-Induced Bias Instability of Oxide TFT by Controlling Sub-Gap States

Year: 2012

Type: conference-abstract

Source: ECS Meeting Abstracts

DOI: 10.1149/ma2012-02/42/3053

Authors: Kyoung-Seok Son, Tae Sang Kim, Joon Seok Park, Hyun-Suk Kim, Seok-Jun Seo, Jong Baek Seon, Kwang Hwan Ji, Jae Kyeong Jeong, Hee-Sung Lee, Seongil Im, Myung Kwan Ryu, Sangyoon Lee

Institutions: Samsung (South Korea), Samsung Advanced Institute of Technology (South Korea), Inha University, Yonsei University

Language: English

Topic: Thin-Film Transistor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W2275319133

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