Molecular ME‐ToF‐SIMS yield as a function of DHB matrix layer thicknesses obtained from brain sections coated by sublimation/deposition techniques
Year: 2015
Type: article
Source: Surface and Interface Analysis
DOI: 10.1002/sia.5885
Institution: University of Münster
Language: English
Subfield: Computational Mechanics
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2277705277