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Lithium Segregation Induced Structure and Strength Change At Amorphous-Si/Cu Interface

Year: 2013

Type: conference-abstract

Source: ECS Meeting Abstracts

DOI: 10.1149/ma2013-02/8/557

Authors: Maria E. Stournara, Xingcheng Xiao, Yue Qi, Priya Johari, Peng Lu, Brian W. Sheldon, Huajian Gao, Vivek B. Shenoy

Institutions: Brown University, General Motors (United States), Shiv Nadar University, University of Pennsylvania

Language: English

Topic: Copper Interconnects and Reliability

Subfield: Electronic, Optical and Magnetic Materials

Field: Materials Science

Domain: Physical Sciences

Open Access status: bronze

OpenAlex ID: W2286303380

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