Work

Indirect measurement of junction temperature for condition monitoring of power semiconductor devices during operation

Year: 2015

Type: conference-paper

Source: PCIM Europe: International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM Europe)

Authors: Bastian Strauss, Andreas Lindemann

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDGs: Affordable and clean energy, Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W2289714974

FWCI: 2.911

Cites:

Cited by: 10

Related to: 10