Work

Characterization of Stress in TlBr devices

Year: 2014

Type: conference-paper

Source: IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

DOI: 10.1109/nssmic.2014.7431266

Authors: Amlan Datta, Shariar Motakef

Institution: CapeSym (United States)

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2294622610

FWCI:

Cites: 12

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Related to: 10