Work

Cathode degradation in TlBr devices

Year: 2014

Type: conference-paper

Source: IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC)

DOI: 10.1109/nssmic.2014.7431285

Authors: Amlan Datta, Shariar Motakef

Institution: CapeSym (United States)

Language: English

Topic: Advanced Semiconductor Detectors and Materials

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2295195840

FWCI:

Cites: 14

Cited by: 1

Related to: 10