Degradation Modeling Based on a Time-Dependent Ornstein-Uhlenbeck Process and Residual Useful Lifetime Estimation
Year: 2015
Type: article
Source: IEEE Transactions on Reliability
Authors: Yingjun Deng, Anne Barros, Antoine Grall
Language: English
Subfield: Safety, Risk, Reliability and Quality
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2295548616
