Work

Open Exchange of Control Patterns: A Pattern-Matching Application of Artificial Intelligence

Year: 2005

Type: preprint

Abstract: This paper proposes formal computational descriptions of “what can go wrong” (WCGW) in an enterprise. Further, it introduces the idea that these formal WCGW artifacts can be represented as patterns that can be stored in an open knowledge repository (OKR), in a format that allows access to any institution.

Source: SSRN Electronic Journal

Authors: Kenneth R. Henry, Ronald Marlin Lee

Institution: Florida International University

Language: English

Topic: AI-based Problem Solving and Planning

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

Open Access status: green

OpenAlex ID: W2297168667

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