Year: 2014
Type: article
Abstract: A method for relative thermal conductivity characterization of thin thermoelectric layers and multi-layered structures in nanometre range using a scanning thermal microscope working in an active constant current mode is suggested. The method requires a very smooth and high quality surface of the studied thermoelectric system. To fulfil these requirements a study of the influence of principal deposition conditions including substrate temperature and laser beam density on surface quality of Bi 2 Te 3 layers prepared by pulsed laser deposition was performed and its results are presented.
Source: Laser Physics
Authors: R Zeipl, M Jelínek, M Vlček, T Kocourek, J Remsa, J Vaniš
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2299979692