Work

Optimal selection of thresholds for photon counting CT

Year: 2016

Type: conference-paper

Source: Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE

DOI: 10.1117/12.2216876

Authors: Thomas O'Donnell, Friederike Schoeck, Rabee Cheheltani, David Cormode, Zahi A. Fayad

Institutions: Siemens Healthcare (United States), Siemens Healthineers (Germany), University of Pennsylvania, Icahn School of Medicine at Mount Sinai

Language: English

Topic: Advanced X-ray and CT Imaging

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W2306410015

FWCI: 0.659

Cites: 5

Cited by: 1

Related to: 10