Design of Extremely Proximity Gettering Using Hydrogen Ion Implantation for Si CMOS Image-Sensor
Year: 2014
Type: conference-abstract
Source: ECS Meeting Abstracts
Institution: Hanyang University
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2310597136
