Year: 2014
Type: article
Abstract: The major resolution-limiting factor in cryoelectron microscopy of unstained biological specimens is radiation damage by the very electrons that are used to probe the specimen structure. To address this problem, an electron microscopy scheme that employs quantum entanglement to enable phase measurement precision beyond the standard quantum limit has recently been proposed [H. Okamoto, Phys. Rev. A 85, 043810 (2012)]. Here we identify and examine in detail measurement errors that will arise in the scheme. Emphasis is given to considerations concerning inelastic scattering events because, in general, schemes assisted with quantum entanglement are known to be highly vulnerable to lossy processes. We find that the amount of error due to both elastic and inelastic scattering processes is acceptable provided that the electron beam geometry is properly designed and the specimen is sufficiently thin.
Source: Physical Review A
Author: Hiroshi Okamoto
Institution: Akita Prefectural University
Language: English
Subfield: Structural Biology
Domain: Life Sciences
Open Access status: green
OpenAlex ID: W2312670523