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Process Yield, Process Centering and Capability Indices for One-Sided Tolerance Processes

Year: 2012

Type: article

Source: Quality Technology & Quantitative Management

DOI: 10.1080/16843703.2012.11673283

Author: Daniel Grau

Institutions: Centre National de la Recherche Scientifique, Université de Pau et des Pays de l'Adour, Laboratoire de Mathématiques et de leurs Applications

Language: English

Topic: Advanced Statistical Process Monitoring

Subfield: Statistics, Probability and Uncertainty

Field: Decision Sciences

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2314754875

FWCI: 4.018

Cites: 4

Cited by: 20

Related to: 10