Work

Three-Dimensional Imaging of Dislocations and Defects in Materials at Atomic Resolution Using Electron Tomography

Year: 2014

Type: article

Abstract: Jianwei Miao, Chien-Chun Chen, M C Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R White, Chin-Yi Chiu, B C Regan, Yu Huang, Laurence D Marks,

Source: Microscopy and Microanalysis

DOI: 10.1017/s143192761400703x

Authors: Jianwei Miao, Chien-Chun Chen, M. C. Scott, Peter Ercius, Chun Zhu, Matthew Mecklenburg, Edward R. White, Chin-Yi Chiu, B. C. Regan, Yu Huang, Laurence D. Marks, Ulrich Dahmen

Institutions: California NanoSystems Institute, University of California, Los Angeles, Lawrence Berkeley National Laboratory, Northwestern University

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: bronze

OpenAlex ID: W2320032939

FWCI:

Cites: 9

Cited by:

Related to: 10