Recalage semi-rigide d'images de scanner aéroporté
Year: 2005
Type: article
Authors: Claude Cariou, Kacem Chehdi
Institutions: Université Rennes 1, Université de Rennes
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W23207475