Work

Electrical Detection of Trapped Charge Displacements Using an Ultra-Thin SOI Percolation Transistor

Year: 2013

Type: conference-paper

Source: ECS Transactions

DOI: 10.1149/05401.0215ecst

Authors: Stephen Fleming, William I Milne, David G Hasko

Institutions: University of Cambridge, Kyung Hee University

Language: English

Topic: Quantum and electron transport phenomena

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Engineering and Physical Sciences Research Council

OpenAlex ID: W2320942527

FWCI:

Cites:

Cited by:

Related to: 10