Work

Strong tip effects in near-field scanning optical tomography

Year: 2007

Type: article

Abstract: A model for the interaction of the scanning probe in near-field scanning optical microscopy is presented. Multiple scattering of the illuminating field with the probe is taken into account. The implications of this so-called strong tip model for the solution of the associated inverse scattering problem are studied through simulations.

Source: Journal of Applied Physics

DOI: 10.1063/1.2812545

Authors: Jin Sun, P. Scott Carney, John C. Schotland

Institutions: University of Illinois Urbana-Champaign, University of Pennsylvania

Language: English

Topic: Near-Field Optical Microscopy

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: green