SVM-based failure detection of GHT localizations
Year: 2016
Type: conference-paper
DOI: 10.1117/12.2216855
Authors: T. Blaffert, C. Lorenz, H. Nickisch, J. Peters, J. Weese
Institution: Philips (Germany)
Language: English
Subfield: Computer Vision and Pattern Recognition
Field: Computer Science
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W2323715046
