Work

Effect of Failure upon WAIS Arithmetic, Digit Span, and Object Assembly Subtests

Year: 1972

Type: article

Source: Psychological Reports

DOI: 10.2466/pr0.1972.30.1.23

Authors: Louis S. Dickstein, Virginia A. Weiss

Institution: Wellesley College

Language: English

Topic: Psychological Testing and Assessment

Subfield: Applied Psychology

Field: Psychology

Domain: Social Sciences

Open Access status: closed

OpenAlex ID: W2323848166

FWCI:

Cites: 11

Cited by: 1

Related to: 10