Year: 1996
Type: article
Abstract: DIFFRACTION C-481 method was applied to process X-ray diffraction patterns from welloriented sols, which allowed us to extract layer-line amplitude distribution reliably.The phase data from the EM analyses were combined with X-ray amplitudes from the native and heavy atom delivatives of the filament to locate heavy atom binding positions in difference Foulier maps.The multiple isomorphous replacement phasing procedure is being applied to deduce electron density maps at higher resolution available in the X-ray data.MS13.03.02
Author: L. Makowski
Institution: Weizmann Institute of Science
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: bronze
OpenAlex ID: W2331974692