Work

Monochromated Low-Voltage Aberration-Corrected TEM for Imaging the Soft/Hard Materials Interface

Year: 2012

Type: article

Source: Microscopy and Microanalysis

DOI: 10.1017/s1431927612009932

Authors: D.C. Bell, D.S. Kohane, B.P. Timko

Institutions: Harvard University, Massachusetts Institute of Technology

Language: English

Topic: Advanced Electron Microscopy Techniques and Applications

Subfield: Structural Biology

Field: Biochemistry, Genetics and Molecular Biology

Domain: Life Sciences

Open Access status: closed

OpenAlex ID: W2334400191

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