Year: 2016
Type: article
Abstract: Metrology is fundamental to all biological, physical and environmental sciences, engineering, and medicine.Standards are required for all measurements.While manufacturing depends on research and development, research and development would not be possible without reliable experimental data, the analytical instrumentation tools and methods to obtain authentic experimental data and the methods to calibrate against standards.It is within this context that The Journal of Scientific and Industrial Metrology is timely and relevant.The demands on metrology have grown over the years.This is particularly the situation in a variety of material scenarios.At the macro level, these scenarios include examples such as alloys, bandgap engineered structures, biomaterials, ceramics, composite materials, coatings, electronic materials, liquid crystals, magnetic materials, metals, metamaterials, nanomaterials, optical materials, polymers, semiconductors, smart materials, superconductors etc.The ability to tailor materials, processes, performance and structure, for desired applications, requires pre-knowledge of the material properties.At the device and systems level, applications of metrology include detectors, drug delivery systems, energy sources, filters, imagers, lasers, process control systems, sensors, waveguides etc.The influence of defects and dislocations on properties becomes significant especially when the structures are scaled from micron to the nanoscale.The enormous progress that has been made in twodimensional materials such as graphene [1], transition metal dichalcogenides/layered metal dichalcogenides (TMDC/LMDC) [2] such as molybdenum disulfide [3], tungsten disulfide [4] and related materials, makes it imperative that the properties of these materials be available to advance the science and applications.
Author: Nuggehalli M Ravindra
Institution: New Jersey Institute of Technology
Language: English
Subfield: Instrumentation
Field: Physics and Astronomy
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W2338081906
