Year: 1999
Type: article
Abstract: The equations of a regression were obtained by methods of mathematical planning of manyfactors experiments.These equations determine a dependence of thermoelectric parameters of PbTe thin films prepared by hot wall the method from technological factors: temperatures of evaporation, walls of the chamber and deposition.PbTe thin films were layed sieged on pins (111) of BaF 2 monocrystals and on amorphous polyamid fillet PM-1.The ranges of change of these thermoelectic parametres were determined.They respond to the best values of thermoelectric parameters of PbTe thin films.It is shown that the value of thermoelectric parameters of PbTe thin polycrystalline films is bigger in several times then the monocrystalline ones.
Author: D.M. Freik
Institution: Vasyl Stefanyk Carpathian National University
Language: English
Subfield: Materials Chemistry
Field: Materials Science
Domain: Physical Sciences
Open Access status: diamond
OpenAlex ID: W2338770049